Q.1
The serial shift register is driven using
  • a) one over-lapping clock
  • b) two over-lapping clock
  • c) one non over-lapping clock
  • d) two non over-lapping clock
Q.2
Which is used to control the scan path movement?
  • a) clock signals
  • b) input signals
  • c) output signals
  • d) delay signals
Q.3
The circuit operation is independent of
  • a) rise time
  • b) fall time
  • c) propagation delays
  • d) all of the mentioned
Q.4
Which is not the function of LSSD method?
  • a) eliminates hazards
  • b) eliminates races
  • c) simplifies fault generation
  • d) stores the data
Q.5
Boundary scan test is used to test
  • a) pins
  • b) multipliers
  • c) boards
  • d) wires
Q.6
The boundary scan path is provided with
  • a) serial input pads
  • b) parallel input pads
  • c) parallel output pads
  • d) buffer pads
Q.7
The boundary scan path tests the
  • a) input nodes
  • b) output nodes
  • c) buffer nodes
  • d) interconnection points
Q.8
Boundary scan method takes lesser time on test pattern generation.
  • a) true
  • b) false
Q.9
The disadvantage of boundary scan method is that the fault coverage is less.
  • a) true
  • b) false
Q.10
Which occupies a lesser area?
  • a) lssd
  • b) boundary scan test
  • c) serial scan
  • d) partial scan
Q.11
The partial scan approach scan
  • a) all input node faults
  • b) all output node faults
  • c) faults not detected by designer functional vector
  • d) all faults
Q.12
In scan/set method __________ is used to implement a scan path.
  • a) serial registers
  • b) storage elements
  • c) parallel registers
  • d) separate register
0 h : 0 m : 1 s