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Vlsi
Vlsi Multiple Choice
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Q.1
The serial shift register is driven using
a) one over-lapping clock
b) two over-lapping clock
c) one non over-lapping clock
d) two non over-lapping clock
Q.2
Which is used to control the scan path movement?
a) clock signals
b) input signals
c) output signals
d) delay signals
Q.3
The circuit operation is independent of
a) rise time
b) fall time
c) propagation delays
d) all of the mentioned
Q.4
Which is not the function of LSSD method?
a) eliminates hazards
b) eliminates races
c) simplifies fault generation
d) stores the data
Q.5
Boundary scan test is used to test
a) pins
b) multipliers
c) boards
d) wires
Q.6
The boundary scan path is provided with
a) serial input pads
b) parallel input pads
c) parallel output pads
d) buffer pads
Q.7
The boundary scan path tests the
a) input nodes
b) output nodes
c) buffer nodes
d) interconnection points
Q.8
Boundary scan method takes lesser time on test pattern generation.
a) true
b) false
Q.9
The disadvantage of boundary scan method is that the fault coverage is less.
a) true
b) false
Q.10
Which occupies a lesser area?
a) lssd
b) boundary scan test
c) serial scan
d) partial scan
Q.11
The partial scan approach scan
a) all input node faults
b) all output node faults
c) faults not detected by designer functional vector
d) all faults
Q.12
In scan/set method __________ is used to implement a scan path.
a) serial registers
b) storage elements
c) parallel registers
d) separate register
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